Threshold voltage

Results: 234



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21IEEE ELECTRON DEVICE LETTERS, VOL. 27, NO. 7, JULYA CMOS, Fully Integrated Sensor for Electronic Detection of DNA Hybridization

IEEE ELECTRON DEVICE LETTERS, VOL. 27, NO. 7, JULYA CMOS, Fully Integrated Sensor for Electronic Detection of DNA Hybridization

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Source URL: www.diee.unica.it

Language: English - Date: 2009-07-22 06:40:24
22RGNBTI PRODUCT BRIEF E N G I N E E R I N G  I N N O V A T I O N

RGNBTI PRODUCT BRIEF E N G I N E E R I N G I N N O V A T I O N

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Source URL: www.ridgetopgroup.com

Language: English - Date: 2015-07-18 01:30:09
233D-stackable Crossbar Resistive Memory based on Field Assisted Superlinear Threshold (FAST) Selector Sung Hyun Jo, Tanmay Kumar, Sundar Narayanan, Wei D. Lu and Hagop Nazarian Crossbar IncPatrick Henry Dr. Suite 1

3D-stackable Crossbar Resistive Memory based on Field Assisted Superlinear Threshold (FAST) Selector Sung Hyun Jo, Tanmay Kumar, Sundar Narayanan, Wei D. Lu and Hagop Nazarian Crossbar IncPatrick Henry Dr. Suite 1

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Source URL: www.crossbar-inc.com

Language: English - Date: 2016-08-15 01:51:06
24NANO LETTERS p-Channel, n-Channel Thin Film Transistors and p−n Diodes Based on Single Wall Carbon Nanotube Networks

NANO LETTERS p-Channel, n-Channel Thin Film Transistors and p−n Diodes Based on Single Wall Carbon Nanotube Networks

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Source URL: rogers.matse.illinois.edu

Language: English - Date: 2004-12-14 17:26:00
25IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS—I: FUNDAMENTAL THEORY AND APPLICATIONS, VOL. 50, NO. 7, JULYAnalysis of Active Pixel Sensor Readout Circuit Khaled Salama and Abbas El Gamal

IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS—I: FUNDAMENTAL THEORY AND APPLICATIONS, VOL. 50, NO. 7, JULYAnalysis of Active Pixel Sensor Readout Circuit Khaled Salama and Abbas El Gamal

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Source URL: isl.stanford.edu

Language: English - Date: 2004-09-20 19:09:51
26IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS—II: ANALOG AND DIGITAL SIGNAL PROCESSING, VOL. 48, NO. 2, FEBRUARYAnalysis of 1=f Noise in Switched MOSFET Circuits Hui Tian and Abbas El Gamal, Fellow, IEEE

IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS—II: ANALOG AND DIGITAL SIGNAL PROCESSING, VOL. 48, NO. 2, FEBRUARYAnalysis of 1=f Noise in Switched MOSFET Circuits Hui Tian and Abbas El Gamal, Fellow, IEEE

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Source URL: isl.stanford.edu

Language: English - Date: 2004-09-20 19:09:51
27SISPAD 2012, September 5-7, 2012, Denver, CO, USA  Analytical Model for the Threshold Voltage Variability due to Random Dopant Fluctuations in Junctionless FETs Antonio Gnudi, Susanna Reggiani, Elena Gnani, Giorgio Bacca

SISPAD 2012, September 5-7, 2012, Denver, CO, USA Analytical Model for the Threshold Voltage Variability due to Random Dopant Fluctuations in Junctionless FETs Antonio Gnudi, Susanna Reggiani, Elena Gnani, Giorgio Bacca

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Source URL: in4.iue.tuwien.ac.at

Language: English - Date: 2013-02-12 08:39:13
    28Microsoft PowerPoint - MF SOM May2.ppt [Compatibility Mode]

    Microsoft PowerPoint - MF SOM May2.ppt [Compatibility Mode]

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    Source URL: kouwenhovenlab.tudelft.nl

    Language: English - Date: 2013-10-31 05:07:21
    29Supplementary information for ‘Quantized conductance in an InSb nanowire’ Ilse van Weperen, Sébastien R. Plissard, Erik P. A. M. Bakkers, Sergey M. Frolov and Leo P. Kouwenhoven 1. Device fabrication and basic chara

    Supplementary information for ‘Quantized conductance in an InSb nanowire’ Ilse van Weperen, Sébastien R. Plissard, Erik P. A. M. Bakkers, Sergey M. Frolov and Leo P. Kouwenhoven 1. Device fabrication and basic chara

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    Source URL: kouwenhovenlab.tudelft.nl

    Language: English - Date: 2013-10-31 04:32:57
    30SISPAD 2012, September 5-7, 2012, Denver, CO, USA  A Physical Model to Predict Grain Boundary Induced Transistor Threshold Voltage Variation in Poly-Si TFTs Chih-Hsiang Ho, Georgios D. Panagopoulos, Chao Lu and Kaushik R

    SISPAD 2012, September 5-7, 2012, Denver, CO, USA A Physical Model to Predict Grain Boundary Induced Transistor Threshold Voltage Variation in Poly-Si TFTs Chih-Hsiang Ho, Georgios D. Panagopoulos, Chao Lu and Kaushik R

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    Source URL: in4.iue.tuwien.ac.at

    Language: English - Date: 2013-02-12 08:39:06